X-ray performance of the engineering prototype Stellar X-Ray Polarimeter
Abstract
The performance of the engineering prototype Stellar X-Ray Polarimeter (SXRP) has been evaluated. One hundred percent polarized monochromatic x rays at 2.6 keV and 9.7 keV were used to measure the response of the instrument in the energy bands of the graphite and lithium polarizing elements, respectively. On-line analysis showed that the respective depths of modulation are 96% ad 70% as expected. Irradiating SXRP with broadband unpolarized x rays in the energy band 2 - 17 keV demonstrated that the level of spurious modulation inherent in the instrument is less than 3%. Up-to-date results are presented and compared to the predictions of Monte Carlo simulations.
- Publication:
-
X-Ray and Ultraviolet Spectroscopy and Polarimetry
- Pub Date:
- November 1994
- DOI:
- 10.1117/12.193200
- Bibcode:
- 1994SPIE.2283...60S